Diffraction in micro-XRF – A tool, rather than a complication?

June 24th, 2025


Live Session 1*
Tuesday
June 24th, 2025
Live Session 2*
Tuesday
June 24th, 2025
10 am CEST / Berlin
4 pm SGT / Singapore
5 pm JST / Tokyo
5 pm CET / Berlin
8 am PST / Los Angeles
11 am JST / New York


What to expect?
Micro-XRF is often understood as a tool for spatially resolved chemical analysis, both qualitative and quantitative. When X-rays are directed at a sample, they induce inner electron shell transitions, and the subsequently emitted radiation is analyzed in terms of intensity and energy to determine the sample's atomic composition.

However, for most metals, ceramics, minerals and other samples with crystalline structure, the X-rays are also diffracted by the samples, resulting in new peaks in the intensity spectrum with only distant relations to fluorescence. These diffraction peaks are often regarded as a nuisance – an undesirable effect that complicates the analysis of fluorescence, experimental setup, or both.

In this webinar, we will explore how diffraction signals in micro-XRF can be leveraged to gain additional insights beyond chemical composition. We will showcase applications in metallurgy, crystal growth, earth sciences, and more, discussing the impact of factors such as structural quality and crystal orientation.




Who should attend?

plus Micro-XRF users in industry, science and R&D

plus People working in metallurgy, the earth sciences, physics and crystallography



Our Speakers
Arrow

Dr. Christian Hirschle

Application Scientist micro-XRF


Arrow

Falk Reinhardt

Application Scientist micro-XRF



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Crystal domains in a cut sample of Sr2DyNbO6 visualized by energy-dispersive Laue mapping on a Bruker M4 TORNADO.

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Our Speakers


Can't Attend the Live Webinar?

Don't worry if you can't attend the live webinar - Register anyway and we will send you the webinar recording and slides shortly after the webinar broadcast.